TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new scanning electron microscope (SEM), the JSM-IT700HR for unprecedentedly high throughput in ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.
Who wouldn’t want to have a scanning electron microscope (SEM)? If you’re the person behind the ProjectsInFlight channel on YouTube, you certainly do. In a recent video it’s explained how he got his ...
Over the last decade, recent electron microscope advancements have created new ways in which to push the boundaries of what is possible with regards to resolution in transmission electron microscopes ...
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